Name: Atomic Force Microscopy: A Concise Introduction (en Inglés)
SKU: 66734861
Price: 122.83 USD
Availability: InStock
Author: Burnham Nancy a
ISBN: 9789819823093

portada Atomic Force Microscopy: A Concise Introduction (en Inglés)

Atomic Force Microscopy: A Concise Introduction (en Inglés)

Formato

Libro Físico

Editorial

World Scientific Publishing Company

Autor

Burnham Nancy a

Idioma

Inglés

N° páginas

250

Encuadernación

Tapa Dura

Dimensiones

22.9x15.2x1.4 cm

ISBN13

9789819823093

Atomic Force Microscopy: A Concise Introduction (en Inglés)

Burnham Nancy A (Autor) · World Scientific Publishing Company · Tapa Dura

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Reseña del libro "Atomic Force Microscopy: A Concise Introduction (en Inglés)"

This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) - a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.Part I - AFM Instrumentation: Explains the working principles, components, and imaging modes of atomic force microscopy, enabling readers to confidently obtain high-quality topographic images from any AFM system.Part II - Force-Curve Acquisition and Interpretation: Guides readers through force spectroscopy, demonstrating how force-distance curves are acquired and interpreted while connecting the results to underlying physical and materials science principles.Advanced Chapter - Dynamic AFM Techniques: Introduces dynamic and resonance-based AFM, using complex numbers and differential equations to explain advanced imaging and measurement methods.