Name: Bsim-Soi Industry-Standard Compact Model: Surface Potential-Based Fet Model for Rfic Design (en Inglés)
SKU: 66885622
Price: 252.99 USD
Availability: InStock
Author: Dabhi, Chetan Kumar; Nandi, Debashish; Rajasekharan, Dinesh

portada Bsim-Soi Industry-Standard Compact Model: Surface Potential-Based Fet Model for Rfic Design (en Inglés)

Bsim-Soi Industry-Standard Compact Model: Surface Potential-Based Fet Model for Rfic Design (en Inglés)

Formato

Libro Físico

Editorial

Woodhead Publishing

Autor

Dabhi, Chetan Kumar; Nandi, Debashish; Rajasekharan, Dinesh

Idioma

Inglés

N° páginas

350

Encuadernación

Tapa Blanda

ISBN13

9780443439049

Bsim-Soi Industry-Standard Compact Model: Surface Potential-Based Fet Model for Rfic Design (en Inglés)

Dabhi, Chetan Kumar; Nandi, Debashish; Rajasekharan, Dinesh (Autor) · Woodhead Publishing · Tapa Blanda

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Reseña del libro "Bsim-Soi Industry-Standard Compact Model: Surface Potential-Based Fet Model for Rfic Design (en Inglés)"

BSIM-SOI Industry-Standard Compact Model: Surface Potential-Based FET Model for RFIC Design provides complete coverage of compact modeling and design techniques specific to SOI transistors. The book is designed to be the first comprehensive guide that thoroughly explains the industry-standard BSIM-SOI compact model, along with the unique modeling and RF design techniques necessary for the accurate extraction and implementation of the industry standard BSIM-SOI model. This book will be a valuable reference for the expanding field of SOI technology, catering specifically to circuit designers, device engineers, academic researchers, and students. This book will equip designers, engineers, and researchers with the knowledge and tools required to optimize SOI-based circuit performance and system integration. The book explains fundamental surface-potential calculations and addresses various real device effects, such as floating body, self-heating, dynamic depletion effects, and layout influences to accurately replicate realistic device behavior. Additionally, the step-by-step parameter extraction procedures for the BSIM-SOI model are outlined, and the results of benchmark tests are also presented.