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portada Deep Learning for Advanced X-ray Detection and Imaging Applications
Formato
Libro Físico
Año
2025
N° páginas
261
Encuadernación
Tapa Dura
Dimensiones
23.5x15.5 cm
ISBN13
9783031756528

Deep Learning for Advanced X-ray Detection and Imaging Applications

Krzysztof Iniewski;Liang Cai (Autor) · Springer International Publishing AG · Tapa Dura

Deep Learning for Advanced X-ray Detection and Imaging Applications - Krzysztof Iniewski;Liang Cai

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Reseña del libro "Deep Learning for Advanced X-ray Detection and Imaging Applications"

This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications.

This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications. Readers will discover why AI is set to revolutionize traditional signal processing and image reconstruction with vastly improved performance. The authors illustrate how Machine Learning (ML) and Deep Learning (DL) significantly advance X-ray detection analysis, image reconstruction, and other crucial steps. This book also reveals how these technologies enable photon counting detector-based X-ray Computed Tomography (CT), which has the potential not only to improve current CT images but also enable new clinical applications, such as providing higher spatial resolution, better soft tissue contrast, K-edge imaging, and simultaneous multi-contrast agent imaging.

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