Name: Non-Destructive Material Characterization Methods (en Inglés)
SKU: 56719857
Price: 467.17 USD
Availability: InStock
Author: Otsuki Akira,Jose Seiko,Mohan Manasa
ISBN: 9780323911504

portada Non-Destructive Material Characterization Methods (en Inglés)

Non-Destructive Material Characterization Methods (en Inglés)

Formato

Libro Físico

Editorial

Elsevier

Autor

Otsuki Akira,Jose Seiko,Mohan Manasa

Idioma

Inglés

N° páginas

840

Encuadernación

Tapa Blanda

ISBN13

9780323911504

N° edición

Non-Destructive Material Characterization Methods (en Inglés)

Otsuki Akira,Jose Seiko,Mohan Manasa (Autor) · Elsevier · Tapa Blanda

Libro Nuevo Importado

Envío: 20 a 27 días háb.

$ 849.40$ 467.17

-45%

Costos de importación incluídos en el precio ✅

Libro Nuevo

Quedan más de 100 unidades

$ 467.17

Llega entre el 09 Nov y el 20 Nov a Quito, Pichincha. Seleccionar ubicación

Agregar a lista de deseos

Reseña del libro "Non-Destructive Material Characterization Methods (en Inglés)"

Non-Destructive Material Characterization Methods provides readers with a trove of theoretical and practical insight into how to implement different non-destructive testing methods for effective material characterization. The book starts with an introduction to the field before moving right into a discussion of a wide range of techniques that can be immediately implemented. Various imaging and microscopy techniques are first covered, with step-by-step insights on characterization using a polarized microscope, an atomic force microscope, computed tomography, ultrasonography, magnetic resonance imaging, infrared tomography, and more. Each chapter includes case studies, applications, and recent developments. From there, elemental assay and mapping techniques are discussed, including Raman spectroscopy, UV spectroscopy, atomic absorption spectroscopy, neutron activation analysis, and various others. The book concludes with sections covering displacement measurement techniques, large-scale facility techniques, and methods involving multiscale analysis and advanced analysis.