Name: Reliability Prediction by Accelerated Life Testing: Methodology & Planning (en Inglés)
Price: 57.93 USD
Availability: InStock
Author: Diana Denice; Manoj Kumar; Prashant P. Marathe
ISBN: 9783659693496

portada Reliability Prediction by Accelerated Life Testing: Methodology & Planning (en Inglés)

Reliability Prediction by Accelerated Life Testing: Methodology & Planning (en Inglés)

Formato

Libro Físico

Editorial

Lap Lambert Academic Publishing

Autor

Diana Denice; Manoj Kumar; Prashant P. Marathe

Idioma

Inglés

N° páginas

Encuadernación

Tapa Blanda

ISBN13

9783659693496

Reliability Prediction by Accelerated Life Testing: Methodology & Planning (en Inglés)

Diana Denice; Manoj Kumar; Prashant P. Marathe (Autor) · Lap Lambert Academic Publishing · Tapa Blanda

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Reseña del libro "Reliability Prediction by Accelerated Life Testing: Methodology & Planning (en Inglés)"

Over the past few decades, reliability has grown to become an important design attribute of critical electronic systems. Reliability is embedded into systems during design phase itself and improved by means of failure analysis & testing. However, it is important to verify the reliability of a critical system before it is deployed. The three well-known methods for reliability prediction are empirical method, physics of failure and life testing. Accelerated life testing, on the other hand is an extension of life testing method where the units under test are subjected to elevated stress levels to induce early failures. The test depends on accelerating the dominant failure mechanisms which reduce the time of testing. The book focuses on reliability prediction of electronic modules by means of accelerated life testing. Step by step planning of the test is the highlight of this book.