portada Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope (en Inglés)

Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope (en Inglés)

Formato

Libro Físico

Autor

Anjam Khursheed

Editorial

World Scientific Publishing Company

Idioma

Inglés

N° páginas

344

Encuadernación

Tapa Dura

Dimensiones

22.9x15.2x2.1 cm

Peso

0.63 kg.

ISBN13

9789811227028

Categorías

Equipamiento, experimentos y técnicas científicas

Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope (en Inglés)

Anjam Khursheed (Autor) · World Scientific Publishing Company · Tapa Dura

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Reseña del libro "Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope (en Inglés)"

This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons, in addition to them being used for imaging. The book will demonstrate how secondary electron energy spectroscopy can transform the SEM into a powerful analytical tool that can map valuable material science information to the nanoscale, superimposing it onto the instrument's normal topographic mode imaging. The book demonstrates how the SEM can then be used to quantify/identify materials, acquire bulk density of states information, capture dopant density distributions in semiconductor specimens, and map surface charge distributions.