Name: Single-Event Effects: Modeling, Prediction, Testing and Radiation Hardening (en Inglés)
SKU: 68468979
Price: 87.12 USD
Availability: InStock
Author: Aguiar Ygor,Martinella Corinna

portada Single-Event Effects: Modeling, Prediction, Testing and Radiation Hardening (en Inglés)

Single-Event Effects: Modeling, Prediction, Testing and Radiation Hardening (en Inglés)

Formato

Libro Físico

Editorial

Mdpi Ag

Autor

Aguiar Ygor,Martinella Corinna

Idioma

Inglés

Encuadernación

Tapa Dura

ISBN13

9783725880294

Single-Event Effects: Modeling, Prediction, Testing and Radiation Hardening (en Inglés)

Aguiar Ygor,Martinella Corinna (Autor) · Mdpi Ag · Tapa Dura

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Reseña del libro "Single-Event Effects: Modeling, Prediction, Testing and Radiation Hardening (en Inglés)"

This Special Issue outlines the growing importance of SEE research as semiconductor technologies develop toward nanometer-scale nodes and the adoption of three-dimensional architectures. Soft errors caused by atmospheric neutrons and alpha particles extend SEE concerns beyond space applications to terrestrial systems, including high-performance computing, autonomous platforms, and safety-critical infrastructure. The ten contributions in this Special Issue address SEE challenges across multiple topics, including device-level modeling; reliability-aware EDA tools; circuit-level hardening-by-design strategies; and experimental characterization in advanced technologies, wide-bandgap devices, and programmable platforms. Several works also explore emerging data-driven approaches for reliability prediction. Collectively, these studies highlight the transition toward integrating radiation resilience directly into modern electronic design methodologies.