Name: Thin Film Deposition and Characterization Techniques (en Inglés)
SKU: 66307794
Price: 62.50 USD
Availability: InStock
Author: Desai, Radhika S.; Dalavi, Dhanaji S.

portada Thin Film Deposition and Characterization Techniques (en Inglés)

Thin Film Deposition and Characterization Techniques (en Inglés)

Formato

Libro Físico

Editorial

LAP Lambert Academic Publishing

Autor

Desai, Radhika S.; Dalavi, Dhanaji S.

Idioma

Inglés

N° páginas

Encuadernación

Tapa Blanda

Dimensiones

22.9x15.2x0.3 cm

ISBN13

9786209396120

Thin Film Deposition and Characterization Techniques (en Inglés)

Desai, Radhika S.; Dalavi, Dhanaji S. (Autor) · LAP Lambert Academic Publishing · Tapa Blanda

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Reseña del libro "Thin Film Deposition and Characterization Techniques (en Inglés)"

This book presents a focused overview of thin-film deposition techniques and their evaluation for advanced energy-storage systems. It highlights two cost-effective and versatile fabrication methods hydrothermal synthesis and electrodeposition, which enable controlled tuning of film morphology, structure, and composition under mild processing conditions. A major emphasis is placed on characterization, as the performance of thin films is closely linked to their structural, chemical, and morphological features. The book covers key analytical tools such as X-ray Diffraction (XRD), Raman spectroscopy, SEM, X-ray Photoelectron Spectroscopy (XPS), BET analysis, and FTIR, explaining how each technique contributes to understanding crystallinity, bonding, oxidation states, elemental composition, and surface area .Additionally, the book details electrochemical performance assessment through CV, GCD and EIS analysis. The book serves as a practical guide for students, researchers, and engineers working on the fabrication and analysis of functional thin films for next-generation energy-storage technologies.