Name: Thorough Investigations and Impact Analysis of Line Outage Contingency (en Inglés)
Price: 56.87 USD
Availability: InStock
Author: Alam, Mehebub ; Thakur, Siddhartha Sankar ; Banerjee, Sumit
ISBN: 9786206158004

portada Thorough Investigations and Impact Analysis of Line Outage Contingency (en Inglés)

Thorough Investigations and Impact Analysis of Line Outage Contingency (en Inglés)

Formato

Libro Físico

Autor

Sumit Banerjee

Mehebub Alam

Siddhartha Sankar Thakur

Editorial

LAP Lambert Academic Publishing

Idioma

Inglés

N° páginas

Encuadernación

Tapa Blanda

Dimensiones

22.9 x 15.2 x 0.4 cm

Peso

0.12 kg.

ISBN13

9786206158004

Categorías

Ingeniería electrónica

Thorough Investigations and Impact Analysis of Line Outage Contingency (en Inglés)

Sumit Banerjee (Autor) · Mehebub Alam (Autor) · Siddhartha Sankar Thakur (Autor) · LAP Lambert Academic Publishing · Tapa Blanda

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Reseña del libro "Thorough Investigations and Impact Analysis of Line Outage Contingency (en Inglés)"

This book presents the research works and investigations related to the contingency due to line outage. Firstly, the detail assessment of the impact of line outage has been studied through PV curve method. Later on, investigation has been carried out to find the most critical line in normal loading condition. In view of this, ranking of the line outage contingencies are done on the basis of proposed overall severity index (OSI) comprising of two index i.e. active power deviation-based index and voltage deviation based index. Furthermore, the critical contingency is identified though well-known L-index. Moreover, the impact of critical contingency is analysed through new indices namely voltage deviation index (VDI) and loss deviation index (LDI). The effectiveness and viability of the proposed schemes are checked on different IEEE benchmark systems in MATLAB environment.