Name: Topological Objects in Correlated Electronic Systems (en Inglés)
SKU: 66575783
Price: 86.57 USD
Availability: InStock
Author: Brazovskii, Serguei; Kirova, Natasha

portada Topological Objects in Correlated Electronic Systems (en Inglés)

Topological Objects in Correlated Electronic Systems (en Inglés)

Formato

Libro Físico

Editorial

Mdpi AG

Autor

Brazovskii, Serguei; Kirova, Natasha

Idioma

Inglés

N° páginas

150

Encuadernación

Tapa Dura

Dimensiones

24.4x17x1.4 cm

ISBN13

9783725855216

Topological Objects in Correlated Electronic Systems (en Inglés)

Brazovskii, Serguei; Kirova, Natasha (Autor) · Mdpi AG · Tapa Dura

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Reseña del libro "Topological Objects in Correlated Electronic Systems (en Inglés)"

Most correlated electronic systems possess ground states that have broken crystal symmetries. Among these is the family of electronic crystals (charge/spin density waves, Wigner crystals, stripes, charge ordering, and electronic ferroelectrics), which are superstructures found in spin systems, such as spin-polarized density waves and superconductors. Their ground-state degeneracy allows for topologically protected configurations that connect equivalent but different states. These "topological defects" include extended objects like plane domain walls; the lines of dislocations or phase vortices; various solitons or skyrmions, which are local microscopic objects; and transient processes like phase slips and space-time vortices. Embedded or transient topologically nontrivial configurations are readily induced by doping or optical pumping, by electric or magnetic fields, or under stresses or sliding. This Reprint includes nine articles that cover the following issues: Topological doping in high-Tc cuprate superconductors;The dynamics of the patterns and networks of defects in Wigner crystals;The scanning probe microscopy of topological defects in multi-ferroics;Miorana states in a topological superconductor;Solitons in a ferroelectric conductor;The coherent X-ray diffraction of sliding solitonic lattices.