Name: Trace-Based Post-Silicon Validation for Vlsi Circuits. (en Inglés)
Price: 173.26 USD
Availability: InStock
Author: Liu, Xiao; Xu, Qiang
ISBN: 9783319005324

portada Trace-Based Post-Silicon Validation for Vlsi Circuits. (en Inglés)

Formato

Libro Físico

Editorial

Springer

Autor

Liu, Xiao; Xu, Qiang

Idioma

Inglés

Encuadernación

Tapa Dura

ISBN13

9783319005324

Trace-Based Post-Silicon Validation for Vlsi Circuits. (en Inglés)

Liu, Xiao; Xu, Qiang (Autor) · Springer · Tapa Dura

Libro Físico

$ 173.26

$ 266.55

Ahorras: $ 93.29

35% descuento

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Origen: Estados Unidos (Costos de importación incluídos en el precio)

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Reseña del libro "Trace-Based Post-Silicon Validation for Vlsi Circuits. (en Inglés)"

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.