Name: Truth and Traceability in Physics and Metrology (Iop Concise Physics) (en Inglés)
SKU: 51235165
Price: 54.83 USD
Availability: InStock
Author: Michael Grabe

portada Truth and Traceability in Physics and Metrology (Iop Concise Physics) (en Inglés)

Truth and Traceability in Physics and Metrology (Iop Concise Physics) (en Inglés)

Formato

Libro Físico

Editorial

Morgan & Claypool

Autor

Michael Grabe

Año

2018

Idioma

Inglés

N° páginas

Encuadernación

Tapa Blanda

ISBN13

9781643270937

Categorías

Aplicaciones industriales de investigación científica e innovación tecnológica

Truth and Traceability in Physics and Metrology (Iop Concise Physics) (en Inglés)

Michael Grabe (Autor) · Morgan & Claypool · Tapa Blanda

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Reseña del libro "Truth and Traceability in Physics and Metrology (Iop Concise Physics) (en Inglés)"

Metrological data is known to be blurred by the imperfections of the measuring process. In retrospect, for about two centuries regular or constant errors were no focal point of experimental activities, only irregular or random error were. Today's notation of unknown systematic errors is in line with this. Confusingly enough, the worldwide practiced approach to belatedly admit those unknown systematic errors amounts to consider them as being random, too. This book discusses a new error concept dispensing with the common practice to randomize unknown systematic errors. Instead, unknown systematic errors will be treated as what they physically are- namely as constants being unknown with respect to magnitude and sign. The ideas considered in this book issue a proceeding steadily localizing the true values of the measurands and consequently traceability.