Name: VLSI IMPLEMENTATION OF BUILT IN SELF-TEST (en Inglés)
SKU: 65445782
Price: 46.40 USD
Availability: InStock
Author: M. Fatima;SHUBHAM SAHU

portada VLSI IMPLEMENTATION OF BUILT IN SELF-TEST (en Inglés)

VLSI IMPLEMENTATION OF BUILT IN SELF-TEST (en Inglés)

Formato

Libro Físico

Editorial

LAP LAMBERT Academic Publishing

Autor

M. Fatima;SHUBHAM SAHU

Año

2025

Idioma

Inglés

N° páginas

Encuadernación

Tapa Blanda

Dimensiones

22x15 cm

ISBN13

9786207807802

VLSI IMPLEMENTATION OF BUILT IN SELF-TEST (en Inglés)

M. Fatima;Shubham Sahu (Autor) · LAP LAMBERT Academic Publishing · Tapa Blanda

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Reseña del libro "VLSI IMPLEMENTATION OF BUILT IN SELF-TEST (en Inglés)"

Built-in Self-Test (BIST) is a technique that integrates additional hardware and software into integrated circuits, enabling them to perform self-testing. A key component often used in BIST is the Linear Feedback Shift Register (LFSR), a shift register where the input bit is a linear function of its previous state.BIST is the standard method for testing embedded memories. Over time, memory BIST techniques have evolved to address the growing demands of advanced technologies and markets. BIST improves testing efficiency by allowing full-speed memory access and reducing manufacturing test time through rapid, on-chip pattern generation.This book focuses on implementing BIST using Verilog HDL on Xilinx ISE 14.7. It includes the design of an LFSR and an SRAM controller to support BIST, enhancing overall system performance.