Name: Advances in Electronic Testing: Challenges and Methodologies (en Inglés)
SKU: 59635556
Price: 140.47 USD
Availability: InStock
Author: Gizopoulos, Dimitris

portada Advances in Electronic Testing: Challenges and Methodologies (en Inglés)

Advances in Electronic Testing: Challenges and Methodologies (en Inglés)

Formato

Libro Físico

Editorial

Springer

Autor

Gizopoulos, Dimitris

Idioma

Inglés

N° páginas

412

Encuadernación

Tapa Blanda

Dimensiones

23.4x15.6x2.3 cm

Peso

0.61 kg.

ISBN13

9781489987730

Categorías

Electrónica: circuitos y componentes
Óptica aplicada
Ciencias de la computación

Advances in Electronic Testing: Challenges and Methodologies (en Inglés)

Gizopoulos, Dimitris (Autor) · Springer · Tapa Blanda

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Reseña del libro "Advances in Electronic Testing: Challenges and Methodologies (en Inglés)"

This new volume in the Frontiers in Electronic Testing book series is devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today's state-of-the-art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey. The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. The book is intended for advanced undergraduate and graduate students, and professionals in the electronic testing realm.