Name: Localization and Metal-Insulator Transitions (en Inglés)
SKU: 58133856
Price: 104.94 USD
Availability: InStock
Author: Fritzche, Hellmut
ISBN: 9781461295211

portada Localization and Metal-Insulator Transitions (en Inglés)

Localization and Metal-Insulator Transitions (en Inglés)

Formato

Libro Físico

Editorial

Springer

Autor

Fritzche, Hellmut

Idioma

Inglés

N° páginas

533

Encuadernación

Tapa Blanda

Dimensiones

25.4x17.8x2.8 cm

Peso

0.94 kg.

ISBN13

9781461295211

Categorías

Física de la materia condensada (física del estado líquido y del estado sólido)
Análisis espectral, espectroquímica, espectrometría de masas
Química física

Localization and Metal-Insulator Transitions (en Inglés)

Fritzche, Hellmut (Autor) · Springer · Tapa Blanda

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Reseña del libro "Localization and Metal-Insulator Transitions (en Inglés)"

This volume and its two companion volumes, entitled Tetrahedrally-Bonded Amorphous Semiconductors and Physics of Disordered Materials, are our way of paying special tribute to Sir Nevill Mott and to express our heartfelt wishes to him on the occasion of his eightieth birthday. Sir Nevill has set the highest standards as a physicist, teacher, and scientific leader. Our feelings for him include not only the respect and admiration due a great scientist, but also a deep affection for a great human being, who possesses a rare combination of outstanding personal qualities. We thank him for enriching our lives, and we shall forever carry cherished memories of this noble man. Scientists best express their thanks by contributing their thoughts and observations to a Festschrift. This one honoring Sir Nevill fills three volumes, with literally hundreds of authors meeting a strict deadline. The fact that contributions poured in from all parts of the world attests to the international cohesion of our scientific community. It is a tribute to Sir Nevill's stand for peace and understanding, transcending national borders. The editors wish to express their gratitude to Ghazaleh Koefod for her diligence and expertise in deciphering and typing many of the papers, as well as helping in numerous other ways. The blame for the errors that remain belongs to the editors.