Name: Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (en Inglés)
Price: 104.70 USD
Availability: InStock
Author: Roberts, Gordon W. ; Lu, Albert K.
ISBN: 9781461359920

portada Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (en Inglés)

Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (en Inglés)

Formato

Libro Físico

Autor

Gordon W. Roberts

Albert K. Lu

Editorial

Springer

Idioma

Inglés

N° páginas

122

Encuadernación

Tapa Blanda

Dimensiones

22.9 x 15.2 x 0.7 cm

Peso

0.19 kg.

ISBN13

9781461359920

Categorías

Ingeniería eléctrica
Electrónica: circuitos y componentes

Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (en Inglés)

Gordon W. Roberts (Autor) · Albert K. Lu (Autor) · Springer · Tapa Blanda

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Reseña del libro "Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (en Inglés)"

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.